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VS9110 OLED: Display
Device Lifetime Test System
Outline
Life Time of Display
Device can be determined by measuring the Luminance degradation.
Figure.2 shows a system used to measure the Life Time of OLED Device. It
consists of:
Functions
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Data
Acquisition Software
Voltage,
Current, Luminance vs Time are being monitored and recorded
simultaneously
Test Data is saved in Text file format.
16 devices can be tested & monitored simultaneously
A 16 channels of power supply provides with 16 individual
current/voltage settings.
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Multi-Channel Power Supply
The Power supplied to the test device can be by a constant Voltage
or Constant Current. VS-9110 Multi-channel Power supply provide 8
channel current/Voltage output, and 8 channel photo current
amplifiers inputs.
-
Luminance Sensor (
Si-Photodiode)
As shown in Figure, the short circuit current (Isc) of Si
Photodiodes has a linear relationship with the light it received
over a wide range. By monitoring the Isc current changes of Si
Photodiode, We are able to know the changes of test device's
Luminance. High performance photo current amplifier enables system
to have accurate Isc measurement over wide range.
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Device Holder & Test
Jig
Based on the customer's Test device, A special designed Device
Holder grantee that Test device has a reliable electric Contact, and
a consistent location of Photodiodes
Other
Options
-
19" Rack with
industrial Computer
All the test equipments, and device holders are mounted inside of
19" rack with the glass door. It keeps life time test reliable &
Safe.
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PV Cell Life Time Test
PV Cell life time test function can be integrated into together. As
shown on Fig. 8. It includes 24 devices solar Cell life time test
software & hardware. The Conversion efficiency (ŋ), Fill factor (FF)
is being monitoring vs Time.
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Multi Substrate Device
Life Time Test
It's monitoring Multi devices' resistance changes in micro ohm.
Download Quick Specs (size:
148KB)
VS-9110 OLED Display Device Lifetime Test System |
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